X-ray spectral microinvestigation of the chemical states of atoms in CdxHg1–x Te—GaAs thin films
Abstract
The results of X-ray spectral investigations of CdxHg1–x Te—GaAs thin films with a Camebax microbeam electron microprobe are presented. It is shown that the sensitivity of the microprobe combined with mathematical processing based on chemometric approaches is sufficient to reveal the effects of the chemical bonds on the X-ray spectra.