Issue 7, 1990

Atomic Spectrometry Update—Inorganic Mass Spectrometry and X-Ray Fluorescence Spectrometry

Abstract

This year's Update includes an extended mass spectrometry section based on full abstracts and covering fully this extensive area of analysis. The newly introduced instrumentation for Glow discharge MS and the combined MS techniques are particularly notable this year. The ICP-MS section continues to grow in line with the increasing number of instruments in use for an ever-expanding variety of applications. The growth of interest in TXRF and synchrotron radiation XRF has been particularly high during the review period.

Article information

Article type
Review Article

J. Anal. At. Spectrom., 1990,5, 243R-277R

Atomic Spectrometry Update—Inorganic Mass Spectrometry and X-Ray Fluorescence Spectrometry

J. R. Bacon, A. T. Ellis and J. G. Williams, J. Anal. At. Spectrom., 1990, 5, 243R DOI: 10.1039/JA990050243R

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