Secondary ion mass spectrometry (SIMS) provides a technique for assessing the degree of uniformity in the composition of zeolite crystals; dealumination of faujasite-like zeolites by a steam/acid leaching process produces a more uniform composition than dealumination by ethylenediaminetetra-acetic acid.
J. Dwyer, F. R. Fitch, F. Machado, G. Qin, S. M. Smyth and J. C. Vickerman, J. Chem. Soc., Chem. Commun., 1981, 422 DOI: 10.1039/C39810000422
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