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Defect dipole-induced domain reorientation of NdFeO3–PbTiO3 thin films

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Abstract

The defect dipoles exist in ferroelectric thin films and they play a unique role in the domain structure. However, most of the previous studies of the ferroelectric domains involve the extrinsic field-induced polarization reverse. Herein, we report domain reorientation induced by the realignment of the defect dipoles at high temperatures in a (100)-oriented NdFeO3–PbTiO3 (NF–PT) thin film. The temperature-dependent XRD results exclude the reorientation of the lattice structures, and the macroscopic ferroelectric hysteresis loop at 150 °C shows greater conductivity, which is induced by the emergence of the out-of-plane defect dipoles. The present study provides a picture to understand the thermal activation of the defect dipoles, which will benefit novel ferroelectric devices.

Graphical abstract: Defect dipole-induced domain reorientation of NdFeO3–PbTiO3 thin films

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Publication details

The article was received on 11 Feb 2018, accepted on 11 Mar 2018 and first published on 14 Mar 2018


Article type: Research Article
DOI: 10.1039/C8QI00132D
Citation: Inorg. Chem. Front., 2018, Advance Article
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    Defect dipole-induced domain reorientation of NdFeO3–PbTiO3 thin films

    Y. Wang, H. Zhao, K. Lin, J. Deng, J. Chen and X. Xing, Inorg. Chem. Front., 2018, Advance Article , DOI: 10.1039/C8QI00132D

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