Defect dipole-induced domain reorientation of NdFeO3–PbTiO3 thin films

Abstract

The defect dipoles exist in ferroelectric thin films and they play a unique role in the domain structure. However, most of the previous studies of the ferroelectric domains involve the extrinsic field-induced polarization reverse. Herein, we report domain reorientation induced by the realignment of the defect dipoles at high temperatures in a (100)-oriented NdFeO₃–PbTiO₃ (NF–PT) thin film. The temperature-dependent XRD results exclude the reorientation of the lattice structures, and the macroscopic ferroelectric hysteresis loop at 150 °C shows greater conductivity, which is induced by the emergence of the out-of-plane defect dipoles. The present study provides a picture to understand the thermal activation of the defect dipoles, which will benefit novel ferroelectric devices.