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Enhanced adhesion of ZnO nanowires during in situ scanning electron microscope peeling

Abstract

The interfacial adhesion behaviour of a ZnO nanowire-Si substrate system is investigated using an in situ scanning electron microscope (SEM) mechanical peeling technique. The peel front of a nanowire advances via stick-slip events, and an equilibrium between the driving and resistant force to separation occurs immediately prior to a slip event. The interfacial adhesion energy is one order higher than predicted theoretically by van der Waals interactions. The enhanced adhesion is primarily attributed to chemical and electrostatic interfacial interactions induced by electron irradiation. This work demonstrates that the operating environment of a nanoscale system could dramatically influence its adhesion behaviour. The findings are expected to have significant implications for interpreting the adhesion behaviour exhibited by a 1D nanostructure-substrate system when applying different testing methodologies, and for the fabrication of future NEMS devices.

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Publication details

The article was received on 18 Dec 2017, accepted on 11 Jan 2018 and first published on 12 Jan 2018


Article type: Paper
DOI: 10.1039/C7NR09423J
Citation: Nanoscale, 2018, Accepted Manuscript
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    Enhanced adhesion of ZnO nanowires during in situ scanning electron microscope peeling

    J. L. Mead, H. Xie, S. Wang and H. Huang, Nanoscale, 2018, Accepted Manuscript , DOI: 10.1039/C7NR09423J

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