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Issue 18, 2018
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Broadband graphene-based photoacoustic microscopy with high sensitivity

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Abstract

Photoacoustic microscopy (PAM) enables the measurement of properties associated with optical absorption within tissues and complements sophisticated technologies employing optical microscopy. An inadequate frequency response as determined by a piezoelectric ultrasonic transducer results, however, in poor depth resolution and inaccurate measurements of the coefficients of optical absorption. We developed a PAM system configured as an attenuated total reflectance sensor with a ten-layer graphene film sandwiched between a prism and water (the coupling medium) for photoacoustic (PA) wave detection. Transients of the PA pressure cause perturbations in the refractive index of the water thereby changing the polarization-dependent absorption of the graphene film. The signal in PA detection involves recording the difference in the temporal-varying reflectance intensity between the two orthogonally polarized probe beams. The graphene-based sensor has an estimated noise-equivalent-pressure sensitivity of ∼550 Pa over an approximately linear pressure response from 11.0 kPa to 55.0 kPa. Moreover, it enables a much broader PA bandwidth detection of up to ∼150 MHz, primarily dominated by a highly localized evanescent field. From the strong optical absorption of inherent hemoglobin, in vivo label-free PAM imaging provided a three-dimensional viewing of the microvasculature of a mouse ear. These results suggest great potential for graphene-based PAM in biomedical investigations, such as microcirculation studies.

Graphical abstract: Broadband graphene-based photoacoustic microscopy with high sensitivity

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Publication details

The article was received on 14 Dec 2017, accepted on 02 Apr 2018 and first published on 12 Apr 2018


Article type: Paper
DOI: 10.1039/C7NR09319E
Citation: Nanoscale, 2018,10, 8606-8614
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    Broadband graphene-based photoacoustic microscopy with high sensitivity

    F. Yang, W. Song, C. Zhang, C. Min, H. Fang, L. Du, P. Wu, W. Zheng, C. Li, S. Zhu and X. Yuan, Nanoscale, 2018, 10, 8606
    DOI: 10.1039/C7NR09319E

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