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Issue 8, 2018
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Experimental and numerical effects of active afterheater addition on the growth of langatate (La3Ga5.5Ta0.5O14) crystals by the Czochralski method

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Abstract

The Czochralski (Cz) technique under an argon/oxygen atmosphere has been used to grow 35 mm diameter La3Ga5.5Ta0.5O14 langatate (LGT) crystals along the Z-axis. Addition of an afterheater is proposed to improve the growth and crystal properties. Two furnace configurations, without and with an afterheater, are investigated experimentally and numerically. A global model for the entire furnace was used in investigating the mechanism of flow, heat transfer, melt–crystal interface shape and 3-d thermal stress considering the crystal anisotropy. Addition of the afterheater changes considerably the thermal field in the growth atmosphere. A decrease of 56% of the maximum von Mises stress and 30% of the interface convexity are found through the use of the afterheater. Experimentally, a more stable growth has been achieved and this resulted in a good quality crystal.

Graphical abstract: Experimental and numerical effects of active afterheater addition on the growth of langatate (La3Ga5.5Ta0.5O14) crystals by the Czochralski method

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Publication details

The article was received on 24 Nov 2017, accepted on 15 Jan 2018 and first published on 16 Jan 2018


Article type: Paper
DOI: 10.1039/C7CE02032E
Citation: CrystEngComm, 2018,20, 1110-1115
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    Experimental and numerical effects of active afterheater addition on the growth of langatate (La3Ga5.5Ta0.5O14) crystals by the Czochralski method

    I. Lasloudji, F. Mokhtari, A. Nehari, G. Alombert-Goget and K. Lebbou, CrystEngComm, 2018, 20, 1110
    DOI: 10.1039/C7CE02032E

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