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Halogen-induced internal heavy-atom effect shortening the emissive lifetime and improving the fluorescence efficiency of thermally activated delayed fluorescence emitters

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Abstract

Halogenation of an electron acceptor in TADF emitters is presented as a feasible strategy for shortening the DF lifetimes of TADF emitters without sacrificing their photoluminescence quantum yields. A greenish-yellow device based on the chloride-substituted emitter (ClPPM) achieves a high external quantum efficiency of 22.2% and an ultra-slow efficiency roll-off of 12.3% at a practical luminance of 1000 cd m−2, which is comparable to the state-of-the-art device performance for green-to-yellow TADF OLEDs at the practical luminance.

Graphical abstract: Halogen-induced internal heavy-atom effect shortening the emissive lifetime and improving the fluorescence efficiency of thermally activated delayed fluorescence emitters

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Publication details

The article was received on 12 Sep 2017, accepted on 07 Nov 2017 and first published on 08 Nov 2017


Article type: Paper
DOI: 10.1039/C7TC04181K
Citation: J. Mater. Chem. C, 2017, Advance Article
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    Halogen-induced internal heavy-atom effect shortening the emissive lifetime and improving the fluorescence efficiency of thermally activated delayed fluorescence emitters

    Y. Xiang, Y. Zhao, N. Xu, S. Gong, F. Ni, K. Wu, J. Luo, G. Xie, Z. Lu and C. Yang, J. Mater. Chem. C, 2017, Advance Article , DOI: 10.1039/C7TC04181K

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