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Degradation of Encapsulated Perovskite Solar Cells Driven by Deep Trap States and Interfacial Deterioration

Abstract

The degradation of encapsulated perovskite device has been investigated by optoelectronic characterizations. The performance of encapsulated device dropped by approximately 50% of initial value after five months. The degradation of device performance was found to be influenced by both interface recombination and deep trap-assisted recombination in the perovskite. The analysis of temperature dependent current-voltage characteristics and capacitance spectra revealed that the decrease in activation energy of interface recombination, deepening of the defect levels and reducing diffusion potential of devices led to deterioration of device parameters with aging. The degradation of the encapsulated device might be governed by dissociation and migration of constituent ions which induces deeper defect level in perovskite layer and deteriorates the interface with aging.

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Publication details

The article was received on 17 Aug 2017, accepted on 28 Nov 2017 and first published on 28 Nov 2017


Article type: Paper
DOI: 10.1039/C7TC03733C
Citation: J. Mater. Chem. C, 2017, Accepted Manuscript
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    Degradation of Encapsulated Perovskite Solar Cells Driven by Deep Trap States and Interfacial Deterioration

    D. B. Khadka, Y. Shirai, M. Yanagida and K. Miyano, J. Mater. Chem. C, 2017, Accepted Manuscript , DOI: 10.1039/C7TC03733C

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