Jump to main content
Jump to site search


Lithography-free electrical transport measurements on 2D materials by direct microprobing

Abstract

We present a method to carry out electrical and opto-electronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts to the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS2 flakes in vertical (transport in the out-of-plane direction) and lateral (transport within the crystal plane) configurations, finding performances comparable to those reported for MoS2 devices fabricated by conventional lithographic process. We also show that this method can be used with other 2D materials.

Back to tab navigation
Please wait while Download options loads

Supplementary files

Publication details

The article was received on 21 Mar 2017, accepted on 15 May 2017 and first published on 15 May 2017


Article type: Paper
DOI: 10.1039/C7TC01203A
Citation: J. Mater. Chem. C, 2017, Accepted Manuscript
  •   Request permissions

    Lithography-free electrical transport measurements on 2D materials by direct microprobing

    P. Gant, Y. Niu, S. A. Svatek, N. Agrait, C. Munuera, M. García-Hernández, R. Frisenda, D. Perez de Lara and A. Castellanos-Gomez, J. Mater. Chem. C, 2017, Accepted Manuscript , DOI: 10.1039/C7TC01203A

Search articles by author