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Lithography-free electrical transport measurements on 2D materials by direct microprobing

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Abstract

We present a method to carry out electrical and optoelectronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts with the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS2 flakes in vertical (transport in the out-of-plane direction) and lateral (transport within the crystal plane) configurations, finding performances comparable to those reported for MoS2 devices fabricated by the conventional lithographic process. We also show that this method can be used with other 2D materials.

Graphical abstract: Lithography-free electrical transport measurements on 2D materials by direct microprobing

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Publication details

The article was received on 21 Mar 2017, accepted on 15 May 2017 and first published on 15 May 2017


Article type: Paper
DOI: 10.1039/C7TC01203A
Citation: J. Mater. Chem. C, 2017, Advance Article
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    Lithography-free electrical transport measurements on 2D materials by direct microprobing

    P. Gant, Y. Niu, S. A. Svatek, N. Agraït, C. Munuera, M. García-Hernández, R. Frisenda, D. P. de Lara and A. Castellanos-Gomez, J. Mater. Chem. C, 2017, Advance Article , DOI: 10.1039/C7TC01203A

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