Jump to main content
Jump to site search


Transmission Electron Microscopy on Metal-Organic Frameworks – A Review

Abstract

Versatile materials like Metal-organic frameworks require careful characterization. Transmission Electron Microscopy is a very powerful method that can address a multitude of investigative challenges. In this review we present TEM studies that yielded valuable insights into the investigated MOFs to illustrate the potential of TEM despite the sensitivity of MOF to the electron beam.

Back to tab navigation

Publication details

The article was received on 06 Jan 2017, accepted on 05 Jun 2017 and first published on 05 Jun 2017


Article type: Review Article
DOI: 10.1039/C7TA00194K
Citation: J. Mater. Chem. A, 2017, Accepted Manuscript
  •   Request permissions

    Transmission Electron Microscopy on Metal-Organic Frameworks – A Review

    C. Wiktor, M. Meledina, S. Turner, O. I. Lebedev and R. A. Fischer, J. Mater. Chem. A, 2017, Accepted Manuscript , DOI: 10.1039/C7TA00194K

Search articles by author

Spotlight

Advertisements