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Influence of supporting amorphous carbon film thickness on measured strain variation within a nanoparticle


Strain variation within nanoparticle plays crucial role in tuning its properties. High Resolution Transmission Electron Microscopy (HRTEM) images of nanoparticle supported on amorphous carbon film are used to determine the strain variation. Experimental measurements in present study on a single crystalline silver nanoparticle exhibited an unexpected high strain variation. Generally, the influence of carbon film is not accounted for during interpretation of measured strain variation. However, experimental observations raise the question: whether the supporting carbon film alters the measured strain variation. In order to address this, strain variation within simulated Ag nanoparticle supported on amorphous carbon is measured with varying film thickness. Results show that supporting carbon film thickness introduces artefact leading to more strain variation than what is present within unsupported nanoparticle. Moreover, the variation increases with increasing supporting carbon film thickness. This effect is more pronounced in thinner nanoparticle. Without considering this influence, interpretation of strain within nanoparticle may introduce severe error which in turn will affect the tunability of desirable properties for different applications. Since strain measurement in this present context depends on accuracy of atomic position, interpretation of any result using atomic position from HRTEM images of nanoparticle needs to consider the influence of supporting film.

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Publication details

The article was received on 16 Jun 2017, accepted on 04 Oct 2017 and first published on 04 Oct 2017

Article type: Paper
DOI: 10.1039/C7NR04334A
Citation: Nanoscale, 2017, Accepted Manuscript
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    Influence of supporting amorphous carbon film thickness on measured strain variation within a nanoparticle

    M. Settem, P. Rajak, M. Islam and S. Bhattacharyya, Nanoscale, 2017, Accepted Manuscript , DOI: 10.1039/C7NR04334A

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