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Facile spectroscopic approach for optoelectronic properties of few-layered graphene oxide thin films and its role in photocatalysis as composite with RF sputtered ZnO

Abstract

Herein we have reported few-layered graphene oxide (GO), reduced graphene oxide (rGO), and rGO/ZnO thin films on a glass substrate by the combination of spin coating, low temperature thermal annealing, and radio frequency (RF) sputtering technique. Spectroscopic approach was applied for the very first time to calculate the optical and dielectric properties of the GO thin films. The GO thin film was characterised for the structural, optical, morphological, and surface chemical state composition properties by X-ray diffraction, UV-visible spectroscopy, atomic force microscopy, field emission scanning electron microscopy, and X-ray photoelectron microscopy. The chemical state analysis of O1s and C1s spectra evidently proved the successful reduction of GO at 200–300 °C. The change in grain size, lattice strain, and dislocation density was studied after the reduction of GO to rGO and the band gap analysis was performed through Tauc plot relation. The optical conductivity of the GO films was estimated by the UV technique. Moreover, the dielectric constant and dielectric loss of GO and rGO thin films were also studied and the samples annealed at high temperature showed comparatively low loss. Owing to the high conductivity and low band gap of few-layered rGO, its composite with RF sputtered ZnO (rGO/ZnO) was studied towards the photocatalytic degradation of 2-chlorophenol.

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Publication details

The article was accepted on 09 Oct 2017 and first published on 10 Oct 2017


Article type: Paper
DOI: 10.1039/C7NJ03614K
Citation: New J. Chem., 2017, Accepted Manuscript
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    Facile spectroscopic approach for optoelectronic properties of few-layered graphene oxide thin films and its role in photocatalysis as composite with RF sputtered ZnO

    A. Jilani, M. H. D. Othman, M. O. Ansari, R. Kumar, A. Alshahrie, A. Ismail, I. U. Khan, V. Sajit and M. A. Barakat, New J. Chem., 2017, Accepted Manuscript , DOI: 10.1039/C7NJ03614K

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