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Issue 9, 2017
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2017 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

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Abstract

This review describes advances in the XRF group of techniques published approximately between April 2016 and March 2017. With technique maturity, it is the sample rather than the instrumentation that limits its wider development, so regular readers are advised to consult our companion application updates for advances in XRF related to specific sample types. In this reconfigured update the Instrumentation section offers advances in hardware and software developments for off-site and laboratory investigations including synchrotron, TXRF and related techniques. However, publications that reflect increasing interest in the non-destructive advantages of X-ray systems for cultural heritage applications remain within this update.

Graphical abstract: 2017 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

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Publication details

The article was received on 30 Jun 2017 and first published on 21 Jul 2017


Article type: Atomic Spectrometry Update
DOI: 10.1039/C7JA90035J
Citation: J. Anal. At. Spectrom., 2017,32, 1629-1649
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    2017 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

    M. West, A. T. Ellis, C. Streli, C. Vanhoof and P. Wobrauschek, J. Anal. At. Spectrom., 2017, 32, 1629
    DOI: 10.1039/C7JA90035J

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