Graphene oxide foils modified by light energetic ions
In this paper, the effect of light ion irradiation on the graphene oxide foils structure and composition was studied. Due to the excellent properties of graphene based materials suitable for application in electronics, optoelectronics, micro-mechanics and space technologies, it is worthy to study the interaction of energetic ions with graphene based structures. From the fundamental point of view, it is also interesting to get the information about the graphene structure modification and the possible functional properties after the irradiation by energetic ions. The light ion irradiation of graphene oxide (GO) foil was performed using 2.5 MeV H+ and 5.1 MeV He2+ ions. The change in the elemental composition of the GO foils after the ion irradiation was investigated using Rutherford Backscattering Spectrometry and Elastic Recoil Detection Analysis. The influence of ion irradiation was further studied by microscopy methods. The chemical composition and structural changes on the GO foil surface were characterized by spectroscopy techniques including XPS, FTIR and Raman spectroscopy. Although results of ion beam analysis indicate no significant change in the bulk of GO foils connected with ion irradiation; the XPS, ATR-FTIR and Raman spectroscopy revealed about the removing of oxygen functionalities and reduction on the surface of graphene oxide. This reduction leads to the surface resistivity decrease after ion irradiation in dependence on the ion specie, fluence and energy.