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Microstructure variations induced by excess PbX2 or AX within perovskite thin films

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Abstract

We systematically investigated the impact of stoichiometric ratio variation between PbX2 and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.

Graphical abstract: Microstructure variations induced by excess PbX2 or AX within perovskite thin films

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Publication details

The article was received on 27 Sep 2017, accepted on 06 Nov 2017 and first published on 06 Nov 2017


Article type: Communication
DOI: 10.1039/C7CC07534K
Citation: Chem. Commun., 2017, Advance Article
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    Microstructure variations induced by excess PbX2 or AX within perovskite thin films

    G. Zheng, C. Zhu, Y. Chen, J. Zhang, Q. Chen, X. Gao and H. Zhou, Chem. Commun., 2017, Advance Article , DOI: 10.1039/C7CC07534K

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