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Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

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Abstract

Tip-enhanced Raman scattering (TERS) can be used to image plasmon-enhanced local electric field variations with extremely high spatial resolution under ambient conditions. This is illustrated through TERS images recorded using a silver atomic force microscope tip coated with strategically selected molecular reporters and used to image a sputtered silver film.

Graphical abstract: Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

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Publication details

The article was received on 05 Apr 2017, accepted on 28 Apr 2017 and first published on 05 May 2017


Article type: Communication
DOI: 10.1039/C7CC02593A
Citation: Chem. Commun., 2017, Advance Article
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    Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

    A. Bhattarai and P. Z. El-Khoury, Chem. Commun., 2017, Advance Article , DOI: 10.1039/C7CC02593A

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