Issue 21, 2016

Cracks bring robustness: a pre-cracked NiO nanosponge electrode with greatly enhanced cycle stability and rate performance

Abstract

The practical application of faradaic capacitors is hampered by electrodes' volume change in the charge/discharge process, which leads to the disintegration of the electrode structure and inferior long-term stability. It is desirable while challenging to develop a low cost and facile method to fabricate an electrode which can effectively accommodate volume expansion/contraction and alleviate the concomitant stress. Herein, taking NiO as an example, a promising route to solve the above issue is demonstrated by purposely introducing cracks in a NiO nanosponge through rapid thermal quenching. The NiO nanosponge is cracked into discrete islands with a size of several micrometers, with each unit strongly connected to a conductive nickel substrate. The small islands of NiO are capable of expanding/contracting freely during repeated charge/discharge processes, leading to a stable mechanical structure and excellent long-term durability. The pre-cracked NiO nanosponge outperforms many state-of-the-art Ni-based electrode materials, with a remarkable rate performance of 1546 F g−1 at 10 mV s−1 and 1109 F g−1 at 200 mV s−1 and no capacitance decay after 5000 cycles. The idea of relieving stress through thermally induced cracks is facile and effective. This will not only help the design of Ni-based electrode materials but also be extended to other transition metal compounds for the performance optimization.

Graphical abstract: Cracks bring robustness: a pre-cracked NiO nanosponge electrode with greatly enhanced cycle stability and rate performance

Supplementary files

Article information

Article type
Paper
Submitted
28 Mar 2016
Accepted
25 Apr 2016
First published
25 Apr 2016

J. Mater. Chem. A, 2016,4, 8211-8218

Cracks bring robustness: a pre-cracked NiO nanosponge electrode with greatly enhanced cycle stability and rate performance

G. Zhang, L. Wang, Y. Liu, W. Li, F. Yu, W. Lu and H. Huang, J. Mater. Chem. A, 2016, 4, 8211 DOI: 10.1039/C6TA02568D

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