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Issue 102, 2016, Issue in Progress
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High-performance CuFe2O4 epitaxial thin films with enhanced ferromagnetic resonance properties

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Abstract

Highly epitaxial thin films of copper ferrite (CuFe2O4) have been fabricated on MgAl2O4 (001) substrates at a growth temperature of 400 °C for the first time, we believe, through a radio-frequency sputtering method. Structural analyses through high-resolution X-ray diffraction (HRXRD), Raman spectroscopy, and high-resolution transmission electron microscopy (HRTEM) all confirm the tetragonal spinel phase of CuFe2O4 epitaxial film and high tetragonal distortion (c/a = 1.08) of its unit cells. The 50 nm-thick T-CuFe2O4 epitaxial film shows unique soft magnetism with small coercivity of 23 Oe and decreased magnetization. However, a superior ferromagnetic linewidth of only ∼93 Oe in the post-annealed T-CuFe2O4 film compared with a linewidth of ∼1500 Oe in T-CuFe2O4 single crystal bulk material is also observed, which indicates that epitaxial growth of oxide thin films combined with proper heat-treatment-induced cation engineering can impose novel functionalities.

Graphical abstract: High-performance CuFe2O4 epitaxial thin films with enhanced ferromagnetic resonance properties

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Publication details

The article was received on 02 Sep 2016, accepted on 10 Oct 2016 and first published on 11 Oct 2016


Article type: Paper
DOI: 10.1039/C6RA22016A
Citation: RSC Adv., 2016,6, 100108-100114
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    High-performance CuFe2O4 epitaxial thin films with enhanced ferromagnetic resonance properties

    R. Zhang, M. Liu, L. Lu, S. Mi, C. Jia and H. Wang, RSC Adv., 2016, 6, 100108
    DOI: 10.1039/C6RA22016A

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