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A high impact peer reviewed journal publishing experimental and theoretical work across the breadth of nanoscience and nanotechnology


High-sensitivity imaging with lateral resonance mode atomic force microscopy

Corresponding authors
Institute of Physics, Academia Sinica, 11529, Taipei, Taiwan
E-mail: yangcw@phys.sinica.edu.tw, ishwang@phys.sinica.edu.tw
Department of Mechanical Engineering, National Taiwan University, 10617, Taipei, Taiwan
Nanoscale, 2016,8, 18421-18427

DOI: 10.1039/C6NR04151E
Received 23 May 2016, Accepted 05 Oct 2016
First published online 07 Oct 2016
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Supplementary Info