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Issue 18, 2016
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Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution

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Abstract

We present a theory that exploits four observables in bimodal atomic force microscopy to produce maps of the Hamaker constant H. The quantitative H maps may be employed by the broader community to directly interpret the high resolution of standard bimodal AFM images as chemical maps while simultaneously quantifying chemistry in the non-contact regime. We further provide a simple methodology to optimize a range of operational parameters for which H is in the closest agreement with the Lifshitz theory in order to (1) simplify data acquisition and (2) generalize the methodology to any set of cantilever–sample systems.

Graphical abstract: Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution

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Publication details

The article was received on 19 Jan 2016, accepted on 07 Apr 2016 and first published on 08 Apr 2016


Article type: Paper
DOI: 10.1039/C6NR00496B
Citation: Nanoscale, 2016,8, 9688-9694
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    Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution

    C. Lai, S. Perri, S. Santos, R. Garcia and M. Chiesa, Nanoscale, 2016, 8, 9688
    DOI: 10.1039/C6NR00496B

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