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The role of relative rate constants in determining surface state phenomena at semiconductor–liquid interfaces

Corresponding authors
Materials Engineering, McGill University, Montréal, Canada
E-mail: asif.iqbal@mail.mcgill.ca, kirk.bevan@mcgill.ca
Phys. Chem. Chem. Phys., 2016, Advance Article

DOI: 10.1039/C6CP04952D
Received 15 Jul 2016, Accepted 28 Sep 2016
First published online 28 Sep 2016
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