Dramatic effect of thermal expansion mismatch on the structural, dielectric, ferroelectric and pyroelectric properties of low-cost epitaxial PZT films on SrTiO3 and Si

R. Moalla; B. Vilquin; G. Saint-Girons; G. Sebald; N. Baboux; R. Bachelet

doi:10.1039/C5CE02311D

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Dramatic effect of thermal expansion mismatch on the structural, dielectric, ferroelectric and pyroelectric properties of low-cost epitaxial PZT films on SrTiO₃ and Si†

R. Moalla,^a B. Vilquin,^a G. Saint-Girons,^a G. Sebald,^b N. Baboux^c and R. Bachelet*^a

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* Corresponding authors

^a Institut des Nanotechnologies de Lyon (INL) – CNRS UMR 5270, Ecole Centrale de Lyon, Bâtiment F7, 36 av. Guy de Collongue, 69134 Ecully Cedex, France
E-mail: romain.bachelet@ec-lyon.fr

^b Laboratoire de Génie Electrique et Ferroélectricité (LGEF) – EA 682, INSA de Lyon, Bâtiment Gustave Ferrié, 8 rue de la Physique, 69621 Villeurbanne Cedex, France

^c Institut des Nanotechnologies de Lyon (INL) – CNRS UMR 5270, INSA de Lyon, Bâtiment Blaise Pascal, 7 avenue Jean Capelle, 69621 Villeurbanne Cedex, France

Abstract

Because of different thermal expansion mismatches between the film and the substrate, either mainly c-oriented or a-oriented tetragonal epitaxial PZT layers are obtained on SrTiO₃ or Si (001) substrates, respectively. The resulting large differences in the dielectric, ferroelectric and pyroelectric properties are measured along the out-of-plane direction.

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Article information

DOI: https://doi.org/10.1039/C5CE02311D
Article type: Communication
Submitted: 26 Nov 2015
Accepted: 10 Feb 2016
First published: 10 Feb 2016

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CrystEngComm, 2016,18, 1887-1891

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Dramatic effect of thermal expansion mismatch on the structural, dielectric, ferroelectric and pyroelectric properties of low-cost epitaxial PZT films on SrTiO₃ and Si

R. Moalla, B. Vilquin, G. Saint-Girons, G. Sebald, N. Baboux and R. Bachelet, CrystEngComm, 2016, 18, 1887 DOI: 10.1039/C5CE02311D

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