Jump to main content
Jump to site search

Issue 23, 2016
Previous Article Next Article

Correlative SEM SERS for quantitative analysis of dimer nanoparticles

Author affiliations


A Raman microscope integrated with a scanning electron microscope was used to investigate plasmonic structures by correlative SEM-SERS analysis. The integrated Raman-SEM microscope combines high-resolution electron microscopy information with SERS signal enhancement from selected nanostructures with adsorbed Raman reporter molecules. Correlative analysis is performed for dimers of two gold nanospheres. Dimers were selected on the basis of SEM images from multi aggregate samples. The effect of the orientation of the dimer with respect to the polarization state of the laser light and the effect of the particle gap size on the Raman signal intensity is observed. Additionally, calculations are performed to simulate the electric near field enhancement. These simulations are based on the morphologies observed by electron microscopy. In this way the experiments are compared with the enhancement factor calculated with near field simulations and are subsequently used to quantify the SERS enhancement factor. Large differences between experimentally observed and calculated enhancement factors are regularly detected, a phenomenon caused by nanoscale differences between the real and ‘simplified’ simulated structures. Quantitative SERS experiments reveal the structure induced enhancement factor, ranging from ∼200 to ∼20 000, averaged over the full nanostructure surface. The results demonstrate correlative Raman-SEM microscopy for the quantitative analysis of plasmonic particles and structures, thus enabling a new analytical method in the field of SERS and plasmonics.

Graphical abstract: Correlative SEM SERS for quantitative analysis of dimer nanoparticles

Back to tab navigation

Supplementary files

Publication details

The article was received on 20 Jul 2016, accepted on 19 Oct 2016 and first published on 19 Oct 2016

Article type: Paper
DOI: 10.1039/C6AN01648K
Citation: Analyst, 2016,141, 6455-6462
  •   Request permissions

    Correlative SEM SERS for quantitative analysis of dimer nanoparticles

    F. J. Timmermans, A. T. M. Lenferink, H. A. G. M. van Wolferen and C. Otto, Analyst, 2016, 141, 6455
    DOI: 10.1039/C6AN01648K

Search articles by author