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Issue 27, 2015
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Elucidating the deprotonation of polyaniline films by X-ray photoelectron spectroscopy

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Abstract

Spin-coated polyaniline (PANI) thin films can be made conductive following treatment with a dopant (reducing or oxidising agent). However, de-doping results in loss of electrical properties. We chemically doped PANI films using p-toluene sulfonic acid (pTSA) and camphor sulfonic acid (CSA) and examined their ability to retain these dopants and their conductive properties in physiological media. Changes in the protonation level of these films were assessed by N 1s core line spectra in X-ray photoelectron spectroscopy (XPS). PANI films were found to de-dope with a decrease in the ratio of N 1s photoelectron signal corresponding to positively charged nitrogen (i.e. –NH2+, [double bond, length as m-dash]NH+) to the total N 1s signal. De-doping of PANI films was confirmed by depletion of the dopant fragment (–SO3) as determined from both XPS and atomic distribution in Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) images. XPS has been successfully used as a tool to elucidate the deprotonation of PANI films and the loss of the dopant from the bulk.

Graphical abstract: Elucidating the deprotonation of polyaniline films by X-ray photoelectron spectroscopy

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Publication details

The article was received on 13 Apr 2015, accepted on 12 Jun 2015 and first published on 16 Jun 2015


Article type: Paper
DOI: 10.1039/C5TC01038A
Citation: J. Mater. Chem. C, 2015,3, 7180-7186
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    Elucidating the deprotonation of polyaniline films by X-ray photoelectron spectroscopy

    M. M. Mahat, D. Mawad, G. W. Nelson, S. Fearn, R. G. Palgrave, D. J. Payne and M. M. Stevens, J. Mater. Chem. C, 2015, 3, 7180
    DOI: 10.1039/C5TC01038A

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