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Issue 48, 2015
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Nanocrystal size distribution analysis from transmission electron microscopy images

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Abstract

We propose a method, with minimal bias caused by user input, to quickly detect and measure the nanocrystal size distribution from transmission electron microscopy (TEM) images using a combination of Laplacian of Gaussian filters and non-maximum suppression. We demonstrate the proposed method on bright-field TEM images of an a-SiC:H sample containing embedded silicon nanocrystals with varying magnifications and we compare the accuracy and speed with size distributions obtained by manual measurements, a thresholding method and PEBBLES. Finally, we analytically consider the error induced by slicing nanocrystals during TEM sample preparation on the measured nanocrystal size distribution and formulate an equation to correct this effect.

Graphical abstract: Nanocrystal size distribution analysis from transmission electron microscopy images

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Publication details

The article was received on 12 Sep 2015, accepted on 06 Nov 2015 and first published on 10 Nov 2015


Article type: Paper
DOI: 10.1039/C5NR06292F
Citation: Nanoscale, 2015,7, 20593-20606
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    Nanocrystal size distribution analysis from transmission electron microscopy images

    M. van Sebille, L. J. P. van der Maaten, L. Xie, K. Jarolimek, R. Santbergen, R. A. C. M. M. van Swaaij, K. Leifer and M. Zeman, Nanoscale, 2015, 7, 20593
    DOI: 10.1039/C5NR06292F

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