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Issue 23, 2015
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Increased localization precision by interference fringe analysis

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Abstract

We report a novel optical single-emitter-localization methodology that uses the phase induced by path length differences in a Mach–Zehnder interferometer to improve localization precision. Using information theory, we demonstrate that the localization capability of a modified Fourier domain signal generated by photon interference enables a more precise localization compared to a standard Gaussian intensity distribution of the corresponding point-spread function. The calculations were verified by numerical simulations and an exemplary experiment, where the centers of metal nanoparticles were localized to a precision of 3 nm.

Graphical abstract: Increased localization precision by interference fringe analysis

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Publication details

The article was received on 26 Mar 2015, accepted on 05 May 2015 and first published on 07 May 2015


Article type: Paper
DOI: 10.1039/C5NR01927C
Citation: Nanoscale, 2015,7, 10430-10437
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    Increased localization precision by interference fringe analysis

    C. G. Ebeling, A. Meiri, J. Martineau, Z. Zalevsky, J. M. Gerton and R. Menon, Nanoscale, 2015, 7, 10430
    DOI: 10.1039/C5NR01927C

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