Issue 10, 2015

(1 − x)(K0.48Na0.52)(Nb0.95−yzTazSby)O3xBi0.5(Na0.82K0.18)0.5ZrO3 lead-free ceramics: composition dependence of the phase boundaries and electrical properties

Abstract

In this work, (1 − x)(K0.48Na0.52)(Nb0.95−yzTazSby)O3-xBi0.5(Na0.82K0.18)0.5ZrO3, {abbreviation: KNNST-BNKZ-x-y-z} lead-free piezoceramics were prepared by a conventional solid-state reaction method, and the composition dependence of their phase structures and electrical properties was systematically discussed. Doping with Sb5+, Ta5+, and BNKZ plays an important role on the phase boundaries as well as piezoelectric activity. A three-phase coexistence involving rhombohedral-orthorhombic-tetragonal (R–O–T) phases was observed in the ceramics with 0.0325 ≤ x ≤ 0.05, 0.035 ≤ x ≤ 0.065, 0.05 ≤ z ≤ 0.08, indicating that doping with BNKZ, Ta5+, and Sb5+ can induce the formation of such a phase boundary by simultaneously increasing TR–O and decreasing TO–T. Enhanced piezoelectric behavior was observed in the ceramics located in the composition region of the R–O–T phase boundary, and a high d33 value of 400 pC N−1 can be attained by refining their compositions (e.g., x = 0.0325, y = 0.035, and z = 0.05), together with a high TC value of ∼240 °C. Of particular interest is that a large electric field-induced strain of 0.18% (Smax/Emax = 706 pm V−1) was also found in the ceramics with x = 0.0325, y = 0.035, and z = 0.05 under a low electric field of 2.5 kV mm−1. As a result, the piezoelectric activity as well as the strain can be operated in the material system by refining x, y, and z content.

Graphical abstract: (1 − x)(K0.48Na0.52)(Nb0.95−y−zTazSby)O3–xBi0.5(Na0.82K0.18)0.5ZrO3 lead-free ceramics: composition dependence of the phase boundaries and electrical properties

Article information

Article type
Communication
Submitted
31 Dec 2014
Accepted
25 Jan 2015
First published
27 Jan 2015

Dalton Trans., 2015,44, 4440-4448

(1 − x)(K0.48Na0.52)(Nb0.95−yzTazSby)O3xBi0.5(Na0.82K0.18)0.5ZrO3 lead-free ceramics: composition dependence of the phase boundaries and electrical properties

X. Lv, J. Wu, D. Xiao, H. Tao, Y. Yuan, J. Zhu, X. Wang and X. Lou, Dalton Trans., 2015, 44, 4440 DOI: 10.1039/C4DT04038D

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