Issue 36, 2015
From the journal:

Chemical Communications

Semiconductor-enhanced Raman scattering for highly robust SERS sensing: the case of phosphate analysis†

Wei Ji,*a   Wei Song,ab   Ichiro Tanabe,a   Yue Wang,b   Bing Zhaob  and  Yukihiro Ozaki*a  

* Corresponding authors

a Department of Chemistry, School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo 669-1337, Japan
E-mail: jiwei@kwansei.ac.jp, ozaki@kwansei.ac.jp

b State Key Laboratory of Supramolecular Structure and Materials, Jilin University, Changchun 130012, P. R. China

Abstract

Quantitative analysis of phosphate anions was achieved by measurement of “turn-off” SERS based on the first-layer effect of a chemical mechanism. More importantly, our results demonstrate that it is possible, by means of semiconductor-enhanced Raman scattering, to enhance the SERS sensing performance including stability and reproducibility.

Graphical abstract: Semiconductor-enhanced Raman scattering for highly robust SERS sensing: the case of phosphate analysis

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Article information

DOI
https://doi.org/10.1039/C5CC02395E
Article type
Communication
Submitted
23 Mar 2015
Accepted
27 Mar 2015
First published
27 Mar 2015

Chem. Commun., 2015,51, 7641-7644

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Semiconductor-enhanced Raman scattering for highly robust SERS sensing: the case of phosphate analysis

W. Ji, W. Song, I. Tanabe, Y. Wang, B. Zhao and Y. Ozaki, Chem. Commun., 2015, 51, 7641 DOI: 10.1039/C5CC02395E

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