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Issue 19, 2014
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Local charge writing in epitaxial SmNiO3 thin films

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Abstract

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM). Combining contact-mode atomic force microscopy, KPFM and electrostatic force microscopy (EFM), we present charge writing processes associated with point defect engineering in SNO thin films. Surface potential tuning in two-terminal devices is demonstrated and compared to thermal control by proximity to the phase transition boundary. The charge distribution, retention, and diffusion on SNO were systematically examined. Local compositional changes by AFM-tip induced electric fields are shown to be a viable approach to spatially engineer electronic properties of correlated oxides towards eventual applications in electronics.

Graphical abstract: Local charge writing in epitaxial SmNiO3 thin films

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Publication details

The article was received on 06 Jan 2014, accepted on 27 Feb 2014 and first published on 28 Feb 2014


Article type: Paper
DOI: 10.1039/C4TC00030G
Citation: J. Mater. Chem. C, 2014,2, 3805-3811
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    Local charge writing in epitaxial SmNiO3 thin films

    F. Yan, F. Schoofs, J. Shi, S. D. Ha, R. Jaramillo and S. Ramanathan, J. Mater. Chem. C, 2014, 2, 3805
    DOI: 10.1039/C4TC00030G

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