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Issue 17, 2014
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Elucidating the nanoscale origins of organic electronic function by conductive atomic force microscopy

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Abstract

Electronic and optoelectronic devices comprising organic materials are highly promising for mechanically flexible and low-cost applications. In recent years, conductive atomic force microscopy (C-AFM) has played a significant part in deciphering the nanoscopic and mesoscopic origins of organic electronic function. C-AFM is uniquely capable of measuring local electrical properties with nanoscale resolution; moreover, in conjunction with complementary atomic force microscope modes, C-AFM enables simultaneous mapping of nanoscale structure and electrical function. This feature article highlights recent progress in applying C-AFM to characterize organic electronic systems including self-assembled monolayers, graphene and related materials, organic semiconductors, and organic photovoltaic heterojunctions.

Graphical abstract: Elucidating the nanoscale origins of organic electronic function by conductive atomic force microscopy

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Publication details

The article was received on 16 Oct 2013, accepted on 09 Dec 2013 and first published on 11 Dec 2013


Article type: Feature Article
DOI: 10.1039/C3TC32050B
Citation: J. Mater. Chem. C, 2014,2, 3118-3128
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    Elucidating the nanoscale origins of organic electronic function by conductive atomic force microscopy

    J. M. Mativetsky, Y. Loo and P. Samorì, J. Mater. Chem. C, 2014, 2, 3118
    DOI: 10.1039/C3TC32050B

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