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Issue 14, 2014
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Field electron emission of layered Bi2Se3 nanosheets with atom-thick sharp edges

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Abstract

Field electron emission properties of solution processed few-layer Bi2Se3 nanosheets are studied for the first time, which exhibit a low turn-on field of 2.3 V μm−1, a high field enhancement factor of up to 6860 and good field emission stability. This performance is better than that of the as reported layered MoS2f sheets and is comparable to that of single layer graphene films. The efficient field emission behaviours are found to be not only attributed to their lower work function but also related to their numerous sharp edges or protrusion decorated structure based on our simulation results. Besides, the contribution of possible two-dimensional electron gas surface states of atom-thick layered Bi2Se3 nanosheets is discussed in this paper. We anticipate that these solution processed layered Bi2Se3 nanosheets have great potential as robust high-performance vertical structure electron emitters for future light weight and highly flexible vacuum micro/nano-electronic device applications.

Graphical abstract: Field electron emission of layered Bi2Se3 nanosheets with atom-thick sharp edges

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Publication details

The article was received on 12 Nov 2013, accepted on 05 May 2014 and first published on 09 May 2014


Article type: Paper
DOI: 10.1039/C3NR06015B
Citation: Nanoscale, 2014,6, 8306-8310
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    Field electron emission of layered Bi2Se3 nanosheets with atom-thick sharp edges

    H. Huang, Y. Li, Q. Li, B. Li, Z. Song, W. Huang, C. Zhao, H. Zhang, S. Wen, D. Carroll and G. Fang, Nanoscale, 2014, 6, 8306
    DOI: 10.1039/C3NR06015B

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