Issue 4, 2014

Tip-enhanced near-field optical microscopy

Abstract

Tip-enhanced near-field optical microscopy (TENOM) is a scanning probe technique capable of providing a broad range of spectroscopic information on single objects and structured surfaces at nanometer spatial resolution and with highest detection sensitivity. In this review, we first illustrate the physical principle of TENOM that utilizes the antenna function of a sharp probe to efficiently couple light to excitations on nanometer length scales. We then discuss the antenna-induced enhancement of different optical sample responses including Raman scattering, fluorescence, generation of photocurrent and electroluminescence. Different experimental realizations are presented and several recent examples that demonstrate the capabilities of the technique are reviewed.

Graphical abstract: Tip-enhanced near-field optical microscopy

Article information

Article type
Review Article
Submitted
16 Jul 2013
First published
08 Oct 2013

Chem. Soc. Rev., 2014,43, 1248-1262

Tip-enhanced near-field optical microscopy

N. Mauser and A. Hartschuh, Chem. Soc. Rev., 2014, 43, 1248 DOI: 10.1039/C3CS60258C

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements