Issue 2, 2014

A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance

Abstract

In this report, it was found that the Napierian logarithm of the electrical resistance is proportional to the reciprocal thickness for the platinum nanofilms. A new method was proposed to determine the thickness of platinum nanofilm simply by measuring its electrical resistance, which is fast and cost effective.

Graphical abstract: A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance

Article information

Article type
Communication
Submitted
29 Aug 2013
Accepted
24 Oct 2013
First published
25 Oct 2013

Anal. Methods, 2014,6, 337-340

A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance

Y. Sun, Z. Wen, F. Xu, Y. Zhang, Y. Shi, H. Dai and Z. Li, Anal. Methods, 2014, 6, 337 DOI: 10.1039/C3AY41488D

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