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Issue 2, 2014
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A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance

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Abstract

In this report, it was found that the Napierian logarithm of the electrical resistance is proportional to the reciprocal thickness for the platinum nanofilms. A new method was proposed to determine the thickness of platinum nanofilm simply by measuring its electrical resistance, which is fast and cost effective.

Graphical abstract: A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance

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Publication details

The article was received on 29 Aug 2013, accepted on 24 Oct 2013 and first published on 25 Oct 2013


Article type: Communication
DOI: 10.1039/C3AY41488D
Citation: Anal. Methods, 2014,6, 337-340
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    A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance

    Y. Sun, Z. Wen, F. Xu, Y. Zhang, Y. Shi, H. Dai and Z. Li, Anal. Methods, 2014, 6, 337
    DOI: 10.1039/C3AY41488D

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