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Issue 20, 2013
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Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size

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Abstract

We present a measurement scheme that enables quantitative detection of the shot noise in a scanning tunnelling microscope while scanning the sample. As test objects we study defect structures produced on an iridium single crystal at low temperatures. The defect structures appear in the constant current images as protrusions with curvature radii well below the atomic diameter. The measured power spectral density of the noise is very near to the quantum limit with Fano factor F = 1. While the constant current images show detailed structures expected for tunnelling involving d-atomic orbitals of Ir, we find the current noise to be without pronounced spatial variation as expected for shot noise arising from statistically independent events.

Graphical abstract: Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size

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Publication details

The article was received on 01 May 2013, accepted on 28 Jul 2013 and first published on 01 Aug 2013


Article type: Paper
DOI: 10.1039/C3NR02216A
Citation: Nanoscale, 2013,5, 9978-9983
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    Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size

    M. Herz, S. Bouvron, E. Ćavar, M. Fonin, W. Belzig and E. Scheer, Nanoscale, 2013, 5, 9978
    DOI: 10.1039/C3NR02216A

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