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Issue 14, 2012
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Hard X-rays meet soft matter: when bottom-up and top-down get along well

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Abstract

The combined approach of bottom-up and top-down routes allows direct soft matter patterning and fabrication of devices using faster and more versatile protocols. In this research news, we briefly describe some of the fundamentals, development, recent progress and perspectives in the fabrication and patterning of functional nanostructured materials by interaction with high energy X-rays.

Graphical abstract: Hard X-rays meet soft matter: when bottom-up and top-down get along well

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Publication details

The article was received on 24 Oct 2011, accepted on 21 Dec 2011 and first published on 30 Jan 2012


Article type: Emerging Area
DOI: 10.1039/C2SM07028F
Citation: Soft Matter, 2012,8, 3722-3729
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    Hard X-rays meet soft matter: when bottom-up and top-down get along well

    P. Innocenzi, L. Malfatti and P. Falcaro, Soft Matter, 2012, 8, 3722
    DOI: 10.1039/C2SM07028F

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