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Issue 20, 2012
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Investigation of ultraviolet optical properties of semiconducting-enriched and metal-enriched single-walled carbon nanotube networks using spectroscopic ellipsometry

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Abstract

The ultraviolet optical properties of semiconducting-enriched and metallic-enriched single-walled carbon nanotube (semi-enriched and m-enriched SWCNT) networks were studied using spectroscopic ellipsometry. According to calculated energy loss function, the energy loss peak assigned to the maximum intensity of π-plasmon energy was found to increase from 4.5 eV to 5.0 eV as SWCNT network composition was changed from m-SWCNT enriched to semi-SWCNT enriched. These results clearly demonstrate that the dielectric response in the 4–6 eV range is sensitive to changes in the surrounding dielectric environment depending on the semi-/m-SWCNT content. Therefore, the spectral shift of this energy loss is attributed to the enhanced electron confinement by the presence of the surface plasmon due to a small amount of m-SWCNT, which is an important phenomenon at the SWCNT network.

Graphical abstract: Investigation of ultraviolet optical properties of semiconducting-enriched and metal-enriched single-walled carbon nanotube networks using spectroscopic ellipsometry

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Publication details

The article was received on 17 May 2012, accepted on 15 Aug 2012 and first published on 17 Aug 2012


Article type: Paper
DOI: 10.1039/C2NR31205K
Citation: Nanoscale, 2012,4, 6532-6536
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    Investigation of ultraviolet optical properties of semiconducting-enriched and metal-enriched single-walled carbon nanotube networks using spectroscopic ellipsometry

    Y. R. Park, W. Kim, M. J. Ko, N. K. Min and C. J. Lee, Nanoscale, 2012, 4, 6532
    DOI: 10.1039/C2NR31205K

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