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Elemental and molecular speciation of lead particles by dynamic C-60 secondary ion mass spectrometry

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Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, USA
E-mail: timothy.brewer@nist.gov
Anal. Methods, 2012,4, 3491-3496

DOI: 10.1039/C2AY25676B
Received 29 Jun 2012, Accepted 29 Aug 2012
First published online 30 Aug 2012
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