Jump to main content
Jump to site search

Issue 24, 2011
Previous Article Next Article

Local chemical composition of nanophase-separated polymer brushes

Author affiliations

Abstract

Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale phase separation of mixed polystyrene–poly(methyl methacrylate) (PS–PMMA) brushes and investigated changes in the top layer as a function of solvent exposure. We deduce that the top-layer of the mixed brushes is composed primarily of PMMA after exposure to acetone, while after exposure to toluene this changes to PS. Access to simultaneously measured topographic and chemical information allows direct correlation of the chemical morphology of the sample with topographic information. Our results demonstrate the potential of s-SNIM for chemical mapping based on distinct infrared absorption properties of polymers with a high spatial resolution of 80 nm × 80 nm.

Graphical abstract: Local chemical composition of nanophase-separated polymer brushes

Back to tab navigation

Publication details

The article was received on 02 Dec 2010, accepted on 15 Apr 2011 and first published on 18 May 2011


Article type: Paper
DOI: 10.1039/C0CP02756A
Citation: Phys. Chem. Chem. Phys., 2011,13, 11620-11626
  •   Request permissions

    Local chemical composition of nanophase-separated polymer brushes

    M. Filimon, I. Kopf, D. A. Schmidt, E. Bründermann, J. Rühe, S. Santer and M. Havenith, Phys. Chem. Chem. Phys., 2011, 13, 11620
    DOI: 10.1039/C0CP02756A

Search articles by author

Spotlight

Advertisements