The influence of X-ray coherence length on TXRF and XSW and the characterization of nanoparticles observed under grazing incidence of X-rays

Abstract

An approach to the chemical characterization and a study of the morphology of very fine fractions of nanoparticles on surfaces can be deduced from experiments using the grazing incidence X-ray Standing Waves (XSW) by means of Total Reflection X-ray Fluorescence (TXRF). Some theoretical aspects not considered until now for TXRF and XSW, e.g. the influence of coherence length of X-rays from different X-ray sources, the particle form, particle size and distribution, are presented and discussed. Results of numerical simulations of XSW-scans considering the modelling of particles are compared with the experimental data obtained from XSW experiments performed at a synchrotron radiation facility. Advantages and limitations of the applied techniques are discussed for the characterization of Au- and CdTe-nanoparticles.