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Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities

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Corresponding authors
a
Department of Materials Science, California Institute of Technology, Pasadena, USA
E-mail: smhaile@caltech.edu
Phys. Chem. Chem. Phys., 2009,11, 8144-8148

DOI: 10.1039/B910903J
Received 03 Jun 2009, Accepted 14 Jul 2009
First published online 27 Jul 2009
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