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Issue 15, 2007
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Observation of intermediate-range order in a nominally amorphous molecular semiconductor film

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Abstract

Synchrotron X-ray diffraction from a nominally amorphous molecular semiconductor film reveals both the presence of intermediate-range order (IRO) corresponding to crystalline domains with an average size of a few nanometres, and the growth of these domains upon exposure of the film to moisture.

Graphical abstract: Observation of intermediate-range order in a nominally amorphous molecular semiconductor film

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Publication details

The article was received on 12 Jan 2007, accepted on 13 Feb 2007 and first published on 20 Feb 2007


Article type: Communication
DOI: 10.1039/B700505A
Citation: J. Mater. Chem., 2007,17, 1458-1461
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    Observation of intermediate-range order in a nominally amorphous molecular semiconductor film

    D. R. Blasini, J. Rivnay, Detlef-M. Smilgies, J. D. Slinker, S. Flores-Torres, H. D. Abruña and G. G. Malliaras, J. Mater. Chem., 2007, 17, 1458
    DOI: 10.1039/B700505A

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