Issue 6, 2003

Glow discharge optical emission spectrometry: moving towards reliable thin film analysis–a short review

Abstract

Glow discharge optical emission spectroscopy (GD-OES) is briefly reviewed, with particular reference to topics relevant to the application field of near surface and thin film analysis. The special needs and requirements for thin film analysis, in contrast to coating and bulk analysis, are pointed out. A task list is developed which shows the requirements of further developments to the technique and the fundamentals. The state-of-the-art is presented in measurement technique, GD source control and design, the effect of traces of molecular gases, correction and quantification procedures, contributions of modelling and, finally, reference materials for thin film analysis.

Article information

Article type
Review Article
Submitted
03 Feb 2003
Accepted
16 Apr 2003
First published
20 May 2003

J. Anal. At. Spectrom., 2003,18, 670-679

Glow discharge optical emission spectrometry: moving towards reliable thin film analysis–a short review

J. Angeli, A. Bengtson, A. Bogaerts, V. Hoffmann, V. Hodoroaba and E. Steers, J. Anal. At. Spectrom., 2003, 18, 670 DOI: 10.1039/B301293J

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