Determination of tellurium in selenium by wavelength dispersive X-ray fluorescence spectrometry

Abstract

An X-ray fluorescence spectrometric procedure has been developed for the determination of tellurium in selenium. The method involves dissolution of the sample in HCl–HNO₃ and measurement of the Te Lα₁ line intensity using a scandium X-ray tube and a flow-proportional counter. In the above determination, the Rayleigh-scattered Sc Kα target line is used as an internal-ratio line. The procedure permits the determination of tellurium in the range 0.5–5% with 2.5% relative standard deviation.