Issue 9, 1989

Routine analytical Fourier transform Raman spectroscopy

Abstract

A variety of applications of the technique of Fourier transform (FT) Raman spectroscopy using a near-infrared laser excitation source have now begun to emerge. The design and construction of a bench-top, analytical-grade FT Raman spectrometer are described. Its specifications are explained and its performance and convenience of use are reported. A variety of analytical applications of the FT Raman technique have been surveyed to demonstrate the versatility of the spectrometer.

Article information

Article type
Paper

Analyst, 1989,114, 1061-1066

Routine analytical Fourier transform Raman spectroscopy

G. Ellis, P. J. Hendra, C. M. Hodges, T. Jawhari, C. H. Jones, P. Le Barazer, C. Passingham, I. A. M. Royaud, A. Sánchez-Blázquez and G. M. Warnes, Analyst, 1989, 114, 1061 DOI: 10.1039/AN9891401061

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