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Article:   Growth and Structure of Water on SiO2Films on Si Investigated by Kelvin Probe Microscopy and in Situ X-ray Spectroscopies

Journal:   Langmuir   [0743-7463]

Author:   Verdaguer,  Albert
Year:  2007     Volume:  23     Issue:  19     Pages:  9699 - 9703

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From 1996/01/10, volume 12: issue 1
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