Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation
作者:
Villarrubia, J.S. S.
期刊:
Journal of research of the National Institute of Standards and Technology
ISSN:
1044-677X
日期:
1997年07日
卷: 102
期: 4
起始页 425-454
PMID:
27805154
DOI:
10.6028/jres.102.030
浏览期刊
1997年01月01日 - 2021年01月31日
Reports on research conducted in the fields of the physical and engineering sciences including metrology and standarization.
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