Single-electron counting statistics and its circuit applicat…
Single-electron counting statistics and its circuit application in nanoscale field-effect transistors at room temperature.
Article, Chapter
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Journal:
NanotechnologyOpens in new Window
Collection:
IOPscience extra
Opens in new Window
Coverage:
- 1990-07-01~present; volume:1~present;issue:1~present
Journal:
NanotechnologyOpens in new Window
Collection:
JISC Institute of Physics: IOP Publishing Read & Publish Agreement: 2020-2023
Opens in new Window
Coverage:
- 1990-07-01~present; volume:1~present;issue:1~present